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"Case Study: Efficient SDD test generation for very large integrated circuits."

Ke Peng et al. (2011)

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DOI: 10.1109/VTS.2011.5783759

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  dblp key:
  - conf/vts/PengBSWT11
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  - https://dblp.org/rec/conf/vts/PengBSWT11
Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor:
Case Study: Efficient SDD test generation for very large integrated circuits. VTS 2011: 78-83

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