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"A Multi-Mode Scannable Memory Element for High Test Application Efficiency ..."

Egor S. Sogomonyan, Adit D. Singh, Michael Gössel (1998)

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DOI: 10.1109/VTEST.1998.670886

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/SogomonyanSG98
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  persistent URL:
  - https://dblp.org/rec/conf/vts/SogomonyanSG98
Egor S. Sogomonyan, Adit D. Singh, Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. VTS 1998: 324-331

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