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"Testing SoC Interconnects for Signal Integrity Using Boundary Scan."

Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nourani (2003)

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DOI: 10.1109/VTEST.2003.1197647

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/TehranipourAN03
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nourani:
Testing SoC Interconnects for Signal Integrity Using Boundary Scan. VTS 2003: 158-172

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