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"Automatic generation of memory built-in self-repair circuits in SOCs for ..."

Tsu-Wei Tseng, Chih-Sheng Hou, Jin-Fu Li (2010)

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DOI: 10.1109/VTS.2010.5469627

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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Tsu-Wei Tseng, Chih-Sheng Hou, Jin-Fu Li:
Automatic generation of memory built-in self-repair circuits in SOCs for minimizing test time and area cost. VTS 2010: 21-26

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