"Multiple redundancy removal during test generation and synthesis."

David M. Wu, Robert M. Swanson (1992)

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DOI: 10.1109/VTEST.1992.232765

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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David M. Wu, Robert M. Swanson:
Multiple redundancy removal during test generation and synthesis. VTS 1992: 274-279

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