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ORCID"Random pattern generation for post-silicon validation of DDR3 SDRAM."
Hao-Yu Yang et al. (2015)
- Hao-Yu Yang, Shih-Hua Kuo, Tzu-Hsuan Huang, Chi-Hung Chen, Chris Lin, Mango Chia-Tso Chao:
Random pattern generation for post-silicon validation of DDR3 SDRAM. VTS 2015: 1-6
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