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"MODIFIED IEEE 33-BUS AND 123-BUS AC-DC HYBRID TEST SYSTEMS."

Xue Li et al. (2022)

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DOI: 10.21227/FCSP-F683

access: closed

type: Data or Artifact

metadata version: 2023-11-30

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/data/10/LiLJLZC22
Xue Li, Bo Li, Tao Jiang, Fangxing Li, Rufeng Zhang, Houhe Chen:
MODIFIED IEEE 33-BUS AND 123-BUS AC-DC HYBRID TEST SYSTEMS. IEEE DataPort, 2022

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