"Multi-Resolution and Noise-Resistant Surface Defect Detection Approach ..."

Shervan Fekri Ershad, Farshad Tajeripour (2017)

> Home

Details and statistics

DOI: 10.1080/08839514.2017.1378012

access: closed

type: Journal Article

metadata version: 2020-08-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/aai/ErshadT17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/aai/ErshadT17
Shervan Fekri Ershad, Farshad Tajeripour:
Multi-Resolution and Noise-Resistant Surface Defect Detection Approach Using New Version of Local Binary Patterns. Appl. Artif. Intell. 31(5-6): 395-410 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.