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"Introspection Into Reliability Aspects in AlGaN/GaN HEMTs With Gate ..."

Sushanta Bordoloi, Ashok Ray, Gaurav Trivedi (2021)

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DOI: 10.1109/ACCESS.2021.3096988

access: open

type: Journal Article

metadata version: 2021-07-29

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Sushanta Bordoloi, Ashok Ray, Gaurav Trivedi:
Introspection Into Reliability Aspects in AlGaN/GaN HEMTs With Gate Geometry Modification. IEEE Access 9: 99828-99841 (2021)

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