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"Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced ..."
Jaehyuk Lim, Jinwoong Lee, Changhwan Shin (2021)
- Jaehyuk Lim
, Jinwoong Lee, Changhwan Shin
:
Probabilistic Artificial Neural Network for Line-Edge-Roughness-Induced Random Variation in FinFET. IEEE Access 9: 86581-86589 (2021)
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