"Decreasing the System Testing Makespan in a Computer Manufacturing Company."

Shih-Wei Lin et al. (2018)

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DOI: 10.1109/ACCESS.2018.2816959

access: open

type: Journal Article

metadata version: 2025-01-19

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Shih-Wei Lin, Chien-Yi Huang, Kuo-Ching Ying, Dar-Lun Chen:
Decreasing the System Testing Makespan in a Computer Manufacturing Company. IEEE Access 6: 16464-16473 (2018)

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