"Unleashing Parallelism With Minimal Test Inflation in Multi-Threaded Test ..."

Louis Y.-Z. Lin, Charles H.-P. Wen (2018)

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DOI: 10.1109/ACCESS.2018.2869029

access: open

type: Journal Article

metadata version: 2022-06-23

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Louis Y.-Z. Lin, Charles H.-P. Wen:
Unleashing Parallelism With Minimal Test Inflation in Multi-Threaded Test Pattern Generation. IEEE Access 6: 49269-49281 (2018)

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