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"Thickness and Refractive Index Measurement System for Multilayered Samples."

Chien-Sheng Liu, Tzu-Yao Weng (2021)

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DOI: 10.1109/ACCESS.2021.3056083

access: open

type: Journal Article

metadata version: 2021-03-02

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Chien-Sheng Liu, Tzu-Yao Weng:
Thickness and Refractive Index Measurement System for Multilayered Samples. IEEE Access 9: 21474-21480 (2021)

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