"Empirical Bayes decision rule for classification on defective items in ..."

Shui-Ching Chang, Tze Fen Li (2006)

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DOI: 10.1016/J.AMC.2006.04.001

access: closed

type: Journal Article

metadata version: 2020-02-21

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Shui-Ching Chang, Tze Fen Li:
Empirical Bayes decision rule for classification on defective items in Weibull distribution. Appl. Math. Comput. 182(1): 425-433 (2006)

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