"Towards artifact-free characterization of surface topography using complex ..."

Jianwei Ma (2005)

> Home

Details and statistics

DOI: 10.1016/J.AMC.2004.12.053

access: closed

type: Journal Article

metadata version: 2020-02-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/amc/Ma05b
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/amc/Ma05b
Jianwei Ma:
Towards artifact-free characterization of surface topography using complex wavelets and total variation minimization. Appl. Math. Comput. 170(2): 1014-1030 (2005)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.