"Multi-view learning based on product and process metrics for software ..."

Ying Sun et al. (2025)

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DOI: 10.1007/S10489-025-06288-6

access: closed

type: Journal Article

metadata version: 2025-03-07

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Ying Sun, Fei Wu, Di Wu, Xiao-Yuan Jing, Yanfei Sun:
Multi-view learning based on product and process metrics for software defect prediction. Appl. Intell. 55(6): 406 (2025)

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