"Two-level differential burn-in policy for spatially heterogeneous defect ..."

Yuan Chen et al. (2021)

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DOI: 10.1016/J.CIE.2021.107768

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type: Journal Article

metadata version: 2022-03-19

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Yuan Chen, Tao Yuan, Suk Joo Bae, Yue Kuo:
Two-level differential burn-in policy for spatially heterogeneous defect units in semiconductor manufacturing. Comput. Ind. Eng. 162: 107768 (2021)

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