"Bring Your Own Device: An overview of risk assessment."

Robert Ogie (2016)

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DOI: 10.1109/MCE.2015.2484858

access: closed

type: Journal Article

metadata version: 2020-06-18

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Robert Ogie:
Bring Your Own Device: An overview of risk assessment. IEEE Consumer Electron. Mag. 5(1): 114-119 (2016)

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