"Using Power Clues to Hack IoT Devices: The power side channel provides for ..."

Jungmin Park, Akhilesh Tyagi (2017)

> Home

Details and statistics

DOI: 10.1109/MCE.2017.2684982

access: closed

type: Journal Article

metadata version: 2020-06-18

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/cem/ParkT17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/cem/ParkT17
Jungmin Park, Akhilesh Tyagi:
Using Power Clues to Hack IoT Devices: The power side channel provides for instruction-level disassembly. IEEE Consumer Electron. Mag. 6(3): 92-102 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.