"Frequency dispersion effect and parameters extraction method for novel ..."

Hongxia Liu et al. (2010)

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DOI: 10.1007/S11432-010-0079-8

access: closed

type: Journal Article

metadata version: 2020-03-02

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  - https://dblp.org/rec/journals/chinaf/LiuKLZT10
Hongxia Liu, Qianwei Kuang, Suzhen Luan, Aaron Zhao, Sai Tallavarjula:
Frequency dispersion effect and parameters extraction method for novel HfO₂ as gate dielectric. Sci. China Inf. Sci. 53(4): 878-884 (2010)

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