"Machine Learning to Tackle the Challenges of Transient and Soft Errors in ..."

Thomas Lange et al. (2020)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2020-03-03

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-2002-08882
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  - https://dblp.org/rec/journals/corr/abs-2002-08882
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux, Dan Alexandrescu, Luca Sterpone:
Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits. CoRR abs/2002.08882 (2020)

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