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"Deep Learning based Intelligent Coin-tap Test for Defect Recognition."

Hongyu Li, Peng Jiang, Tiejun Wang (2022)

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DOI: 10.48550/ARXIV.2203.12594

access: open

type: Informal or Other Publication

metadata version: 2022-03-30

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  - journals/corr/abs-2203-12594
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  - https://dblp.org/rec/journals/corr/abs-2203-12594
Hongyu Li, Peng Jiang, Tiejun Wang:
Deep Learning based Intelligent Coin-tap Test for Defect Recognition. CoRR abs/2203.12594 (2022)

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