Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Machine Learning Techniques for Identifying the Defective Patterns in ..."

Kamal Taha (2023)

> Home

Details and statistics

DOI: 10.48550/ARXIV.2310.10705

access: open

type: Informal or Other Publication

metadata version: 2023-10-25

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/corr/abs-2310-10705
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-2310-10705
Kamal Taha:
Machine Learning Techniques for Identifying the Defective Patterns in Semiconductor Wafer Maps: A Survey, Empirical, and Experimental Evaluations. CoRR abs/2310.10705 (2023)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.