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"OCR is All you need: Importing Multi-Modality into Image-based Defect ..."
Chih-Chung Hsu et al. (2024)
- Chih-Chung Hsu, Chia-Ming Lee, Chun-Hung Sun, Kuang-Ming Wu:
OCR is All you need: Importing Multi-Modality into Image-based Defect Detection System. CoRR abs/2403.11536 (2024)
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