"Extraction of Secrets from 40nm CMOS Gate Dielectric Breakdown Antifuses ..."

Andrew D. Zonenberg et al. (2025)

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DOI: 10.48550/ARXIV.2501.13276

access: open

type: Informal or Other Publication

metadata version: 2025-02-25

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  - journals/corr/abs-2501-13276
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  - https://dblp.org/rec/journals/corr/abs-2501-13276
Andrew D. Zonenberg, Antony Moor, Daniel Slone, Lain Agan, Mario Cop:
Extraction of Secrets from 40nm CMOS Gate Dielectric Breakdown Antifuses by FIB Passive Voltage Contrast. CoRR abs/2501.13276 (2025)

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