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"Functional Testing of Semiconductor Random Access Memories."

Magdy S. Abadir, Hassan K. Reghbati (1983)

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DOI: 10.1145/356914.356916

access: closed

type: Journal Article

metadata version: 2018-11-06

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  - https://dblp.org/rec/journals/csur/AbadirR83
Magdy S. Abadir, Hassan K. Reghbati:
Functional Testing of Semiconductor Random Access Memories. ACM Comput. Surv. 15(3): 175-198 (1983)

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