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"Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep ..."
Benoît W. Denkinger et al. (2020)
- Benoît W. Denkinger
, Flavio Ponzina
, Soumya Basu, Andrea Bonetti
, Szabolcs Balási
, Martino Ruggiero, Miguel Peón Quirós
, Davide Rossi
, Andreas Burg
, David Atienza
:
Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep Learning Based Edge Devices. IEEE Des. Test 37(2): 84-92 (2020)
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