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"A New Testing Acceleration Chip for Low-Cost Memory Tests."
Michihiro Inoue, Toshio Yamada, Atsushi Fujiwara (1993)
- Michihiro Inoue, Toshio Yamada, Atsushi Fujiwara:
A New Testing Acceleration Chip for Low-Cost Memory Tests. IEEE Des. Test Comput. 10(1): 15-19 (1993)
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