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"Guest Editors' Introduction: System IC Design Challenges beyond 32 nm."

William H. Joyner Jr., David C. Yeh (2008)

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DOI: 10.1109/MDT.2008.95

access: closed

type: Journal Article

metadata version: 2020-05-17

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  persistent URL:
  - https://dblp.org/rec/journals/dt/JoynerY08
William H. Joyner Jr., David C. Yeh:
Guest Editors' Introduction: System IC Design Challenges beyond 32 nm. IEEE Des. Test Comput. 25(4): 294-295 (2008)

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