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"Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Samir Naik, Frank Agricola, Wojciech Maly (1993)

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DOI: 10.1109/54.211524

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/journals/dt/NaikAM93
Samir Naik, Frank Agricola, Wojciech Maly:
Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect Modeling and I/Sub DDQ/ Testing. IEEE Des. Test Comput. 10(2): 13-23 (1993)

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