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"Fault Models and Tests for a 2-Bit-per-Cell MLDRAM."

Michael Redeker, Bruce F. Cockburn, Duncan G. Elliott (1999)

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DOI: 10.1109/54.748802

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/RedekerCE99
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  persistent URL:
  - https://dblp.org/rec/journals/dt/RedekerCE99
Michael Redeker, Bruce F. Cockburn, Duncan G. Elliott:
Fault Models and Tests for a 2-Bit-per-Cell MLDRAM. IEEE Des. Test Comput. 16(1): 22-31 (1999)

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