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"Test Considerations for Gate Oxide Shorts in CMOS ICs."

Jerry M. Soden, Charles F. Hawkins (1986)

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DOI: 10.1109/MDT.1986.294977

access: closed

type: Journal Article

metadata version: 2021-03-05

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Jerry M. Soden, Charles F. Hawkins:
Test Considerations for Gate Oxide Shorts in CMOS ICs. IEEE Des. Test 3(4): 56-64 (1986)

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