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"A robust semi-supervised learning scheme for development of within-batch ..."

Yi Shan Lee, Junghui Chen (2024)

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DOI: 10.1016/J.ENGAPPAI.2024.107920

access: closed

type: Journal Article

metadata version: 2024-05-31

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Yi Shan Lee, Junghui Chen:
A robust semi-supervised learning scheme for development of within-batch quality prediction soft-sensors. Eng. Appl. Artif. Intell. 133: 107920 (2024)

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