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"Improved 3LIN Hardness via Linear Label Cover."
Prahladh Harsha et al. (2019)
- Prahladh Harsha, Subhash Khot, Euiwoong Lee, Devanathan Thiruvenkatachari:
Improved 3LIN Hardness via Linear Label Cover. Electron. Colloquium Comput. Complex. TR19 (2019)
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