"Content-Based Image Retrieval for Semiconductor Process Characterization."

Kenneth W. Tobin et al. (2002)

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DOI: 10.1155/S1110865702203017

access: open

type: Journal Article

metadata version: 2021-07-25

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Kenneth W. Tobin, Thomas P. Karnowski, Lloyd F. Arrowood, Regina K. Ferrell, James S. Goddard, Fred Lakhani:
Content-Based Image Retrieval for Semiconductor Process Characterization. EURASIP J. Adv. Signal Process. 2002(7): 704-713 (2002)

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