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"An adaptive heuristic algorithm for VLSI test vectors selection."

Walid Ibrahim et al. (2009)

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DOI: 10.1016/J.EJOR.2008.03.049

access: closed

type: Journal Article

metadata version: 2021-04-09

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Walid Ibrahim, Hesham El-Sayed, Amr El-Chouemi, Hoda H. Amer:
An adaptive heuristic algorithm for VLSI test vectors selection. Eur. J. Oper. Res. 199(3): 630-639 (2009)

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