Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Spatial defect pattern recognition on semiconductor wafers using ..."

Tao Yuan, Way Kuo (2008)

> Home

Details and statistics

DOI: 10.1016/J.EJOR.2007.06.007

access: closed

type: Journal Article

metadata version: 2020-02-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/eor/YuanK08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/eor/YuanK08
Tao Yuan, Way Kuo:
Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference. Eur. J. Oper. Res. 190(1): 228-240 (2008)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.