"SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded ..."

Nicolas Guelfi, Benoît Ries (2008)

> Home

Details and statistics

DOI: —

access: open

type: Informal or Other Publication

metadata version: 2019-05-22

- view
  - electronic edition @ ercim.eu (open access)
- export record
  dblp key:
  - journals/ercim/GuelfiR08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ercim/GuelfiR08
Nicolas Guelfi, Benoît Ries:
SESAME: A Model-Driven Test Selection Process for Safety-Critical Embedded Systems. ERCIM News 2008(75) (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.