"Genetic Algorithm-based Test Generation for Software Product Line with the ..."

Xue-Lin Li et al. (2018)

> Home

Details and statistics

DOI: 10.1007/S10664-016-9494-9

access: closed

type: Journal Article

metadata version: 2020-08-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ese/LiWGHH18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ese/LiWGHH18
Xue-Lin Li, W. Eric Wong, Ruizhi Gao, Linghuan Hu, Shigeru Hosono:
Genetic Algorithm-based Test Generation for Software Product Line with the Integration of Fault Localization Techniques. Empir. Softw. Eng. 23(1): 1-51 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.