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"Decision fusion approach for detecting unknown wafer bin map patterns ..."
Jaeyeon Jang, Gyeong Taek Lee (2023)
- Jaeyeon Jang, Gyeong Taek Lee:
Decision fusion approach for detecting unknown wafer bin map patterns based on a deep multitask learning model. Expert Syst. Appl. 215: 119363 (2023)
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