"Optimization of optical lens-controlled scanning electron microscopic ..."

Byungwhan Kim, Sanghee Kwon, Donghwan Kim (2010)

> Home

Details and statistics

DOI: 10.1016/J.ESWA.2009.05.007

access: closed

type: Journal Article

metadata version: 2017-05-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/eswa/KimKK10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/eswa/KimKK10
Byungwhan Kim, Sanghee Kwon, Donghwan Kim:
Optimization of optical lens-controlled scanning electron microscopic resolution using generalized regression neural network and genetic algorithm. Expert Syst. Appl. 37(1): 182-186 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.