default search action
"Automated defect inspection of light-emitting diode chips using neural ..."
Hong-Dar Lin (2009)
- Hong-Dar Lin:
Automated defect inspection of light-emitting diode chips using neural network and statistical approaches. Expert Syst. Appl. 36(1): 219-226 (2009)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.