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"Learning from single-defect wafer maps to classify mixed-defect wafer maps."

Jaewoong Shim, Seokho Kang (2023)

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DOI: 10.1016/J.ESWA.2023.120923

access: closed

type: Journal Article

metadata version: 2023-10-14

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Jaewoong Shim, Seokho Kang:
Learning from single-defect wafer maps to classify mixed-defect wafer maps. Expert Syst. Appl. 233: 120923 (2023)

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