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"SCL - Segmentation-Classification combined Loss for surface defect detection."

Emiliano Versini, Lauro Snidaro, Alessandro Liani (2022)

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DOI: 10.1016/J.ESWA.2022.116710

access: closed

type: Journal Article

metadata version: 2022-05-18

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Emiliano Versini, Lauro Snidaro, Alessandro Liani:
SCL - Segmentation-Classification combined Loss for surface defect detection. Expert Syst. Appl. 198: 116710 (2022)

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