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"Stitching defect detection and classification using wavelet transform and ..."

Wai Keung Wong et al. (2009)

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DOI: 10.1016/J.ESWA.2008.02.066

access: closed

type: Journal Article

metadata version: 2017-11-06

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  - https://dblp.org/rec/journals/eswa/WongYFCF09
Wai Keung Wong, C. W. M. Yuen, D. D. Fan, L. K. Chan, E. H. K. Fung:
Stitching defect detection and classification using wavelet transform and BP neural network. Expert Syst. Appl. 36(2): 3845-3856 (2009)

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