"A tomographic workflow to enable deep learning for X-ray based foreign ..."

Mathé T. Zeegers et al. (2022)

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DOI: 10.1016/J.ESWA.2022.117768

access: open

type: Journal Article

metadata version: 2022-12-05

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Mathé T. Zeegers, Tristan van Leeuwen, Daniël Maria Pelt, Sophia Bethany Coban, Robert van Liere, Kees Joost Batenburg:
A tomographic workflow to enable deep learning for X-ray based foreign object detection. Expert Syst. Appl. 206: 117768 (2022)

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