"A Selective Scan Slice Encoding Technique for Test Data Volume and Test ..."

Nabil Badereddine et al. (2008)

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DOI: 10.1007/S10836-007-5053-Z

access: closed

type: Journal Article

metadata version: 2023-03-21

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Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault:
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electron. Test. 24(4): 353-364 (2008)

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