![](https://dblp.org/img/logo.ua.320x120.png)
![](https://dblp.org/img/dropdown.dark.16x16.png)
![](https://dblp.org/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.org/img/search.dark.16x16.png)
![search dblp](https://dblp.org/img/search.dark.16x16.png)
default search action
"Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing."
Hsiu-Ming (Sherman) Chang, David C. Keezer (2012)
- Hsiu-Ming (Sherman) Chang, David C. Keezer:
Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing. J. Electron. Test. 28(5): 555-556 (2012)
![](https://dblp.org/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.