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"Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing."

Hsiu-Ming (Sherman) Chang, David C. Keezer (2012)

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DOI: 10.1007/S10836-012-5330-3

access: open

type: Journal Article

metadata version: 2020-09-11

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Hsiu-Ming (Sherman) Chang, David C. Keezer:
Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and MEMS Testing. J. Electron. Test. 28(5): 555-556 (2012)

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