"A Single Event Upset Resilient Latch Design with Single Node Upset Immunity."

Xixi Dai et al. (2019)

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DOI: 10.1007/S10836-019-05823-X

access: closed

type: Journal Article

metadata version: 2021-04-29

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  - https://dblp.org/rec/journals/et/DaiWCLCY19
Xixi Dai, Haibin Wang, Jiamin Chu, Zhi Liu, Li Cai, Kang Yan:
A Single Event Upset Resilient Latch Design with Single Node Upset Immunity. J. Electron. Test. 35(6): 909-916 (2019)

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